Electrostatic energy analysis of 8-oxoguanine DNA lesion—molecular dynamics study |
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Authors: | Miroslav Pinak |
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Affiliation: | Radiation Risk Analysis Laboratory, Japan Atomic Energy Research Institute, Shirakata, Shirane 2-4, 319-1195, Tokai, Ibaraki, Japan |
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Abstract: | One nanosecond molecular dynamics (MD) simulation was performed for two DNA segments each composed of 30 base pairs. In one DNA segment the native guanines at nucleotides positions 17 and 19 were replaced with two 8-oxoguanines (8-oxoG) (8-oxoG is mutagenic DNA oxo-lesion). The analysis of results was focused on the electrostatic energy that is supposed to be significant factor causing the disruption of DNA base stacking in DNA duplex and may also serve as a signal toward the repair enzyme informing the presence of the lesion. The repulsive interaction between 8-oxoG and the entire DNA molecule was observed, which caused the extrahelical position of 8-oxoG (position 19). The repulsive electrostatic interaction between both 8-oxoG lesions contributed to the flipping out of one 8-oxoG and to the local instability of the lesioned DNA region. The electrostatic potential at the surface of DNA close to the lesions has more negative value than the same region on the native DNA. This electrostatic potential may signal presence of the lesion to the repair enzyme. In the simulation of native DNA segment, no significant structural changes were observed and B-DNA structure was well preserved throughout the MD simulation. |
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Keywords: | 8-Oxoguanine DNA Electrostatic energy Flipped-out base MD |
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