Post-buckling analysis for the precisely controlled buckling of thin film encapsulated by elastomeric substrates |
| |
| Authors: | Hanqing Jiang Yugang Sun John A Rogers Yonggang Huang |
| |
| Institution: | 1. Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, AZ 85287, USA;2. Center for Nanoscale Materials, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439, USA;3. Department of Materials Science and Engineering, Beckman Institute, and Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, 1304 West Green Street, Urbana, IL 61801, USA;4. Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA;5. Department of Civil and Environmental Engineering and Department of Mechanical Engineering, Northwestern University, Evanston, IL 60208, USA |
| |
| Abstract: | The precisely controlled buckling of stiff thin films (e.g., Si or GaAs nano ribbons) on the patterned surface of elastomeric substrate (e.g., poly(dimethylsiloxane) (PDMS)) with periodic inactivated and activated regions was designed by Sun et al. Sun, Y., Choi, W.M., Jiang, H., Huang, Y.Y., Rogers, J.A., 2006. Controlled buckling of semiconductor nanoribbons for stretchable electronics. Nature Nanotechnology 1, 201–207] for important applications of stretchable electronics. We have developed a post-buckling model based on the energy method for the precisely controlled buckling to study the system stretchability. The results agree with Sun et al.’s (2006) experiments without any parameter fitting, and the system can reach 120% stretchability. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
