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On the SINR statistics of a VFDM cognitive spectrum sharing system
Institution:1. Department of Informatics and Telecommunications, National and Kapodistrian University of Athens, 15784 Athens, Greece;2. Department of Informatics and Telecommunications, University of Peloponnese, 22100 Tripolis, Greece;1. Electronics and Communication Engineering Department, National Institute of Technology, Hamirpur, India;2. Department of Electronics and Communication Engineering, Motilal Nehru National Institute of Technology Allahabad, India;1. Department of Electrical and Electronics Engineering, Bilkent University, Ankara, 06800, Turkey;2. Laboratory of Information and Decision Systems, Massachusetts Institute of Technology (MIT), Cambridge, MA 02139, United States
Abstract:An analytical precise approximation of the SINR statistics of the two-tier Vandermonde-subspace frequency division multiplexing (VFDM) cognitive spectrum sharing systems over frequency-selective Rayleigh fading channels is presented. It is shown that the gamma distribution provides the best fitting accuracy and that its use leads to simple, yet accurate, closed-form expressions for evaluating the ergodic capacity (EC) and average bit error probability (ABEP) performance of such systems. In deriving these expressions, the parameters of the gamma distribution have been obtained for various operating conditions of the considered VFDM system using distribution fitting. Furthermore, regression analysis has been used to obtain approximate analytical expressions for these parameters in relation to the system operating parameters. Performance evaluation results, obtained for various system implementations, including the standardized IEEE 802.11 and 3GPP LTE, are presented to demonstrate the validity of the proposed methodology. Its accuracy has been verified by means of computer simulations.
Keywords:Cognitive radio  Two-tier spectrum sharing  Vandermonde-subspace frequency division multiplexing (VFDM)  SINR statistics approximation  Ergodic capacity  Average bit-error probability (ABEP)
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