Transport property characterization of sparse CNT networks via AFM images

A simulation method for correlating the resistivity and resistance of sparse carbon nanotube (CNT) networks via atomic force microscopy images was proposed. For the demonstration, resistance values simulated by this method were compared with values obtained by directory measuring the resistance of sparse CNT networks. Results were also compared with those obtained by a thin-film approximation in which CNT networks are approximated as thin rectangles. Simulated resistance values were closer to the experimental values of the same samples than those estimated on the basis of the thin-film approximation. The use of atomic force microscopy (AFM) images enabled the implementation of inhomogeneity to numerical models, as well as one-to-one comparison between real samples and numerical models.