Polarization and intensity of Compton scattering |
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Authors: | Naoki Saito Ryohei Tanaka Jun Kawai |
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Institution: | Department of Materials Science and Engineering, Kyoto University, Kyoto, Japan |
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Abstract: | X-ray spectra scattered at 90° by acrylic resin plates of various thicknesses are measured. The intensity and polarization of Compton-scattered X-rays are estimated from the spectra. As the thickness of the slab increases, the intensity increases but the polarization decreases. The optimal thickness for a polarized X-ray fluorescence spectrometer is determined, which provides both high intensity and high polarization. |
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Keywords: | Doppler effect polarization XRF polarized X-rays white X-ray polarization |
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