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Electron inelastic mean free path (IMFP) values of Kapton,polyethylene (PE), polymethylmethacrylate (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE) measured with elastic peak electron spectroscopy (EPES)
Authors:Wolfgang S M Werner  Fabian Helmberger  Manuel Schürrer  Olga Ridzel  Michael Stöger-Pollach  Christoph Eisenmenger-Sittner
Institution:1. Institut für Angewandte Physik, Vienna University of Technology, Vienna 1040, Austria;2. Schlumberger Moscow Research Center, Moscow 125171, Russia;3. Institut für Festkörperhysik, Vienna University of Technology, Vienna 1040, Austria
Abstract:Elastic peak electron spectroscopy (EPES) was employed to measure the inelastic mean free path (IMFP) for energies between 500 and 1600 eV for five insulating organic compounds: Kapton, polyethylene (PE), poly(methyl methacrylate) (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE). A Ni and a Si sample were used as reference materials to avoid measurement of the elastic reflection coefficient in absolute units. Correction of experimental elastic peak intensities for surface excitations was performed which turned out to be essential. The results are compared with recent evaluations of optical constants to yield the IMFP in the literature giving satisfactory agreement, with deviations generally below 20%. Investigation of the kinematics in an electron reflection experiment shows that the dispersion coefficient used in REELS data analysis cannot be identified with the true plasmon dispersion.
Keywords:AES  elastic peak electron spectroscopy  inelastic mean free path  Kapton  organic polymers  plasmon dispersion  polyethylene  polymethylmetacrylate  polystyrene  polytetrafluoroethylene  XPS
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