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A two-point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects
Authors:Alexander G Shard  Ako Miisho  Jean-Luc Vorng  Rasmus Havelund  Ian S Gilmore  Satoka Aoyagi
Institution:1. National Physical Laboratory, Teddington, UK;2. Kobelco Research Institute, Inc., Kobe, Japan;3. Department of Materials and Life Science, Seikei University, Tokyo, Japan
Abstract:Quantification of the composition of binary mixtures in secondary ion mass spectrometry (SIMS) is required in the analyses of technological materials from organic electronics to drug delivery systems. In some instances, it is found that there is a linear dependence between the composition, expressed as a ratio of component volumes, and the secondary ion intensities, expressed as a ratio of intensities of ions from each component. However, this ideal relationship fails in the presence of matrix effects and linearity is observed only over small compositional ranges, particularly in the dilute limits. In this paper, we assess an empirical method, which introduces a power law dependence between the intensity ratio and the volume fraction ratio. A previously published physical model of the organic matrix effect is employed to test the limits of the method and a mixed system of 3,3′-bis(9-carbazolyl) biphenyl and tris(2-phenylpyridinato)iridium (III) is used to demonstrate the method. This paper introduces a two-point calibration, which determines both the exponent in the power law and the sensitivity factor for the conversion of ion intensity ratio into volume fraction ratio. We demonstrate that this provides significantly improved accuracy, compared with a one-point calibration, over a wide compositional range in SIMS quantification and with a weak dependence on matrix effects. Because the method enables the use of clearly identifiable secondary ions for quantitative purposes and mitigates commonly observed matrix effects in organic materials, the two-point calibration method could be of significant benefit to SIMS analysts.
Keywords:calibration  enhancement  matrix effects  metrology  molecular ions  organic electronics  quantitation  secondary ion mass spectrometry  suppression  surface analysis
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