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Characterization of thin-film electroluminescent structures by SIMS and other analytical techniques |
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| Authors: | Antson H Grasserbauer M Hamilo M Hiltunen L Koskinen T Leskelä M Niinistö L Stingeder G Tammenmaa M |
| Institution: | 1.Department of Chemistry, Helsinki University of Technology, SF-02150, Espoo, Finland ;2.Institute for Analytical Chemistry, Technical University of Vienna, Getreidemarkt 9, A-1060, Vienna, Austria ;3.Display Technology Division, Lohja Corporation, Olarinluoma 9, SF-02200, Espoo, Finland ; |
| Abstract: | Analytical and Bioanalytical Chemistry - The recently developed Atomic Layer Epitaxy (ALE) method produces good quality electroluminescent thin-film structures which can be used in various display... |
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