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一种衬底波纹注入的宽频带高PSR无片外电容LDO
引用本文:唐太龙,刘凡,廖鹏飞,肖淋洋.一种衬底波纹注入的宽频带高PSR无片外电容LDO[J].微电子学,2024,54(2):207-213.
作者姓名:唐太龙  刘凡  廖鹏飞  肖淋洋
作者单位:中电科芯片技术集团有限公司, 重庆 400060;集成电路与微系统全国重点实验室, 重庆 400060
基金项目:重庆市自然科学基金面上项目(CSTC2021JCYZ-MSXMX1197)
摘    要:基于40 nm CMOS工艺,设计了一种具有高频高电源抑制(PSR)的无片外电容 低压差线性稳压器(LDO)电路。电路采用1.1 V电源供电,LDO输出电压稳定在0.9 V。仿真结果表明,传统无片外电容LDO电路的PSR将会在环路的单位增益 频率(UGF)处上升到一个尖峰,之后才经输出节点处的电容到地的通路开始降低,最高时PSR甚至大于0 dB。采用新型的衬底波纹注入技术的LDO能很好地抑制PSR的尖峰,可以做到全频段都在-20 dB以上,相比传统结构,尖峰处的PSR提高了20 dB以上。该LDO适用于需要低电压供电的射频电路。

关 键 词:无片外电容低压差线性稳压器    高PSR    衬底波纹注入
收稿时间:2023/10/18 0:00:00

A Wideband High-PSR Capless-LDO with Body-Ripple Injection
TANG Tailong,LIU Fan,LIAO Pengfei,XIAO Linyang.A Wideband High-PSR Capless-LDO with Body-Ripple Injection[J].Microelectronics,2024,54(2):207-213.
Authors:TANG Tailong  LIU Fan  LIAO Pengfei  XIAO Linyang
Institution:CETC Chips Technology Group Co., Ltd., Chongqing 400060, P.R.China; National Key Laboratory of Integrated Circuits and Microsystems, Chongqing 400060, P.R.China
Abstract:A high-PSR capless-LDO circuit with body-ripple injection based on 40 nm CMOS IC process was designed. The circuit is powered by a 1.1 V power supply, and the LDO output voltage is stable at 0.9 V. Simulation results show that the PSR of conventional capless-LDO circuit increases to a peak at the UGF of the loop and then begin to decrease through the capacitor-to-ground path at the output node. The highest PSR is even greater than 0 dB. The LDO using the new substrate ripple injection technology can adequately suppress the PSR peak and achieve the entire frequency band above -20 dB. Compared with the conventional structure, the PSR at the peak increases by more than 20 dB. The LDO can be applied to RF circuits that require low voltage power supplies.
Keywords:capless-LDO  high-PSR  body-ripple injection
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