Negative and positive secondary ion mass spectra of organic acids

Organic compounds can be ionized by sputtering the solid sample. The resulting negative and positive secondary ions provide mass spectra which characterize both the molecular weights and the structures of the compounds. Ionization occurs either by direct ejection of charged species from the solid into vacuum or by electron or proton transfer. The sputtered secondary ions dissociate unimolecularly to give fragment ions. These reactions are identical to those which occur when the secondary ions are independently generated by chemical ionization, selected by mass and dissociated in a high energy gas phase collision. The negative ion SIMS spectra show molecular ions (M^?.) or (M-H)^? ions as the dominant high mass species together with fragments due to decarboxylation, dehydration and losses of other simple molecules. Stronger acids show larger (M-H)^?/M^?.abundance ratios. The positive ion spectra are complementary and also useful in characterizing molecular structures. Attachment of cations to organic molecules (cationization) occurs much more readily than anion attachment and this makes negative SIMS spectra simpler than these positive ion counterparts.