Tracer studies of anodic films formed on aluminium in malonic and oxalic acids

Using a tungsten-containing layer, incorporated into sputtering-deposited aluminium, as a tracer, the growth of porous anodic films in malonic and oxalic acid electrolytes has been investigated using transmission electron microscopy, Rutherford backscattering spectroscopy and nuclear reaction analysis. Comparisons were also made with films formed in phosphoric acid electrolyte, which have been studied previously. The findings reveal a distortion of the tracer layer within the barrier region of the porous films, evident as a lagging of the tracer beneath the pores relative to that in the adjacent cell wall region. Further, the films are significantly thicker than the layer of metal consumed during anodizing and display smooth-sided pores. The anodizing behaviours are consistent with a major role for field-assisted flow of film material within the barrier layer in the development of the pores.