|
|||||
|
|
Mössbauer spectroscopy and magnetic properties in thin films of FexNi100−x electroplated on silicon (1 0 0) |
|
| Authors: | LS de Oliveira JBM da Cunha B Hallouche |
| Institution: | a Departamento de Física-CFM, Universidade Federal de Santa Catarina, Florianópolis, SC, Brazil b Instituto de Física, Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, Brazil c Departamento de Física e Química, Universidade de Santa Cruz do Sul, Santa Cruz do Sul, RS, Brazil |
| Abstract: | FexNi100−x thin films were produced by galvanostatic electrodeposition on Si (1 0 0), nominal thickness 2800 nm, and x ranging 7-20. The crystalline structure of the sample was determined by X-ray diffraction (XRD). The magnetic properties were investigated by vibration sample magnetometry (VSM) and room temperature 57Fe Mössbauer spectroscopy. Conversion Electron Mössbauer spectroscopy (CEMS) in both film surfaces for the thick self-supported films showed that the magnetic moment direction is in the plane and conventional transmission (MS) that the directions are out of the plane films. The results were interpreted assuming a three-layer model where the external layer has in-plane magnetization and the internal one, out of plane magnetization. |
| Keywords: | 75 20 En Metals and alloys 75 30 Gw Magnetic anisotropy 76 80+y Mö ssbauer effect Other γ-ray spectroscopy |
| 本文献已被 ScienceDirect 等数据库收录！ | |