Modification of Cd1−xMnxTe crystal surface layers by nanopulsed laser irradiation |
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Authors: | EI Gatskevich AI Rarenko VN Strebegev |
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Institution: | a Institute of Electronics, National Academy of Sciences, Minsk, Belarus b Chernivtsi National University, Chernivtsi, Ukraine |
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Abstract: | The surface modification of Cd1−xMnxTe (x = 0-0.3) crystal wafers under pulsed laser irradiation has been studied. The samples were irradiated by a Q-switched ruby laser with pulse duration of 80 ns. Optical diagnostics of laser-induced thermal processes were carried out by means of time-resolved reflectivity measurements at wavelengths 0.53 and 1.06 μm. Laser irradiation energy density, E varied in the range of 0.1-0.6 J/cm2. Morphology of irradiated surface was studied using scanning electron microscopy. The energy density whereby the sample surface starts to melt, depends on Mn content and is equal to 0.12-0.14 J/cm2 for x ≤ 0.2, in the case of x = 0.3 this value is about 0.35 J/cm2. The higher Mn content leads to higher melt duration. The morphology of laser irradiated surface changes from a weakly modified surface to a single crystal strained one, with an increase in E. Under irradiation with E in the range of 0.21-0.25 J/cm2, the oriented filamentary crystallization is observed. The Te inclusions on the surface are revealed after the irradiation of samples with small content of Mn. |
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Keywords: | CdMnTe Laser irradiation Phase transformation Reflectivity Scanning electron microscopy |
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