Physical properties of vacuum evaporated CdTe thin films with post-deposition thermal annealing |
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| Affiliation: | 1. School of Energy Studies, Department of Physics, University of Pune, Pune 411 007, India;2. Department of Physics, Anantrao Pawar College, Pirangut, Pune 412 115, India;3. UGC–DAE–CSR, University Campus, Khandwa Road, Indore 452 017, India;4. Department of Physics, B.R. Gholap College, New Sangvi, Pune 411 027, India;5. Department of Physics, H.V. Desai College, Budhwar Peth, Pune 411 002, India;1. State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012, PR China;2. Department of Physics and Chemistry, Heihe University, Heihe 164300, PR China;3. Institute of Atomic and Molecular Physics, Jilin University, Changchun 130012, PR China;1. Nano and Thin Film Laboratory, Physics Department, Faculty of Science, South Valley University, Qena 83523, Egypt;2. Physics Department, Faculty of Applied Medical Sciences, Taif University, Turabah 21995, Saudi Arabia;3. Nanomaterials Laboratory, Physics Department, Faculty of Science, South Valley University, Qena 83523, Egypt;4. Nano-Science & Semiconductor Lab, Physics Department, Faculty of Education, Ain Shams University, Cairo, Egypt;5. Physics Department, Faculty of Science, King Khalid University, P.O. Box 9004, Abha, Saudi Arabia;1. Centre for Nanoscience and Nanotechnology, Jamia Millia Islamia (A Central University), New Delhi, 110025, India;2. PHENIX UMR 8234 Sorbonne Universities, Université Pierre et Marie Curie, Paris-06, France;1. University of Bucharest, Faculty of Physics, 405 Atomistilor Street, PO Box MG-11, 077125 Magurele-Ilfov, Romania;2. Photonics Laboratory, Angers University, 2 Bd. Lavoisier, 49045 Angers, France;3. Academy of Romanian Scientists, 54 Splaiul Independenţei, Bucharest, Romania;1. Physics Department, Faculty of Science, Sohag University, 82524, Sohag, Egypt;2. Physics Department, College of Science, Jouf University, Al-Jouf, Sakaka, P.O. Box 2014, Sakaka, Saudi Arabia |
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| Abstract: | This paper presents the physical properties of vacuum evaporated CdTe thin films with post-deposition thermal annealing. The thin films of thickness 500 nm were grown on glass and indium tin oxide (ITO) coated glass substrates employing thermal vacuum evaporation technique followed by post-deposition thermal annealing at temperature 450 °C. These films were subjected to the X-ray diffraction (XRD),UV-Vis spectrophotometer, source meter and atomic force microscopy (AFM) for structural, optical, electrical and surface morphological analysis respectively. The X-ray diffraction patterns reveal that the films have zinc-blende structure of single cubic phase with preferred orientation (111) and polycrystalline in nature. The crystallographic and optical parameters are calculated and discussed in brief. The optical band gap is found to be 1.62 eV and 1.52 eV for as-grown and annealed films respectively. The I–V characteristics show that the conductivity is decreased for annealed thin films. The AFM studies reveal that the surface roughness is observed to be increased for thermally annealed films. |
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| Keywords: | CdTe thin films Physical properties Thermal annealing Vacuum evaporation Characterization |
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