Characterization of the channel walls roughness in photonic crystal fibers |
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| Affiliation: | 1. Donbass State Engineering Academy, Kramatorsk 84313, Ukraine;2. Grupo de Materia Condensada-UdeA, Instituto de Física, Facultad de Ciencias Exactas y Naturales, Universidad de Antioquia-UdeA, Calle 70 No. 52-21, Medellín, Colombia;3. Escuela de Ingeniería de Antioquia-EIA, Medellín, Colombia;4. Facultad de Ciencias, Universidad Autónoma del Estado de Morelos, Ave. Universidad 1001, CP 62209 Cuernavaca, Morelos, México;5. Institute of Physics, Kyiv 80028, Ukraine;1. Department of Physics and Astronomy, University of Manitoba, Winnipeg, Canada R3T 2N2;2. Department of Solid State Physics, Yerevan State University, Yerevan, Armenia;1. School of Materials Science and Engineering, Shandong Jianzhu University, Jinan 250101, PR China;2. Beijing Aeronautical Manufacturing Technology Research Institute, Beijing 100024, PR China;1. Institute of Strength Physics and Materials Science of SB RAS, 2/4 Akademichesky Avenue, Tomsk 634021, Russia;2. V.D. Kuznetsov Siberian Physical Technical Institute of Tomsk State University, 1 Novosobornaja Square, Tomsk 634050, Russia |
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| Abstract: | We present electron microscope (FEI NanoSEM) and atomic force microscopy measurements of surface roughness in nanochannels in photonic crystal fibers (PCF). A method was invented to cleave the PCF along the axis without damaging the surface structure in the nanochannels allowing us to characterize the morphology of the nanochannels in the PCF. A multi-wall carbon nanotube mounted onto commercial AFM probes and super sharp silicon non-contact mode AFM probes were used to characterize the wall roughness in the nanochannels. The roughness is shown to have a Gaussian distribution, and has an amplitude smaller than 0.5 nm. The height–height correlation function is an exponential correlation function with an autocorrelation length of 13 nm, and 27 nm corresponding with scan sizes of 200×100 nm2, and 1600×200 nm2, respectively. |
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| Keywords: | Photonic crystal fibers Surface roughness AFM SEM Height–height correlation Autocorrelation length |
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