Effect of lateral tensile stresses on the low-temperature electrical resistivity and magnetoresistance of La0.67Ca0.33MnO3 nanofilms

The thickness of the buffer layer of strontium titanate introduced between an La_0.67Ca_0.33MnO₃ manganite film and a (001)La_0.29Sr_0.71Al_0.65Ta_0.35O₃ substrate is varied (d ₁ = 7–70 nm) to influence effective misfit m in their lattice parameters. As m increases, electrical resistivity ρ of the film increases sharply and the maximum in the ρ(T) dependence shifts toward low temperatures. At T < 150 K, the temperature dependence of ρ of the manganite film obeys the relationship ρ = ρ₁ + ρ₂ T ^4.5, where parameter ρ₁ is independent of the temperature and magnetic field. Coefficient ρ₂ decreases with increasing magnetic field and increases with the misfit between the lattice parameters of the film and substrate, i.e., when the effective hole concentration in the manganite layer decreases.