Application of direct solid analysis of plant samples by electrothermal vaporization-inductively coupled plasma atomic emission spectrometry: Determination of Cd and Si for environmental purposes

Elemental determinations are usually performed on plant samples for agronomic or environmental studies. Direct solid sampling is possible when electrothermal vaporization (ETV) is used as a method of sample introduction in inductively coupled plasma atomic emission spectrometry (ICP-AES). ETV-ICP-AES was applied for elemental determinations in plant samples. The first application aimed at Cd determinations in very small size plant material samples. Several reference plant materials were used to validate the accuracy of the method. Quality control included the systematic analysis of a reference sample in each batch of unknown samples. The performance of the method in time was illustrated by a control chart. The second application aimed at the content of Si in plant materials. Quantification of Si in plant samples was carried out using samples issued from an inter-laboratory test. Detection limit of 30 μg g^− 1 was achieved for Si. In all cases, quantification was accomplished easily by means of aqueous standard solutions deposited on cellulose support.