The defect character of interface junction lines

Junction lines, where three or more interfaces meet in polycrystalline materials, are analysed from a topological point of view. Using circuit mapping methods, it is shown that, in contiguous polyerystals, the dislocations constituting the interfaces always react at junctions according to topological conservation principles. This conclusion is at variance with recent suggestions in the literature. In addition, it is shown that, in certain circumstances, junction lines can themselves exhibit defect character, i.e., dislocation and/or disclination character. Such defects arise in order to accommodate the coexistence of the abutting crystals. Simple examples are illustrated.