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Ab initio calculations on oxygen vacancy defects in strained amorphous silica
Authors:Bao-Hua Zhou  Fu-Jie Zhang  Xiao Liu  Yu Song  Xu Zuo
Affiliation:(College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300071,China;Microsystem and Terahertz Research Center,China Academy of Engineering Physics,Chengdu 610200,China;Institute of Electronic Engineering,China Academy of Engineering Physics,Mianyang 621999,China;Key Laboratory of Photoelectronic Thin Film Devices and Technology of Tianjin,Tianjin 300350,China)
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