Atomic XAFS as a tool to probe the electronic properties of supported noble metal nanoclusters |
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| Authors: | van der Eerden Ad M J Visser Tom Nijhuis T Alexander Ikeda Yasuo Lepage Muriel Koningsberger Diek C Weckhuysen Bert M |
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| Affiliation: | Department of Inorganic Chemistry and Catalysis, Debye Institute, Utrecht University, Sorbonnelaan 16, 3584 CA Utrecht, The Netherlands. |
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| Abstract: | Atomic XAFS is a very attractive technique for probing electronic properties of supported metal nanoclusters. For platinum nanoparticles on different supports, the technique is found to be in good agreement with infrared CO adsorption measurements. The advantages of AXAFS, however, are that no probe molecule is required and that real-time measurements under reaction conditions are possible. |
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