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Photoemission study of CaF2 on Si(001)-2×1 during annealing |
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| Authors: | T-W Pi L-C TienJ-F Wen C-P OuyangC-P Cheng J Hwang |
| Institution: | a Synchrotron Radiation Research Center, Hsinchu, Taiwan, ROC b Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan, ROC c Department of Applied Physics, National Chiayi University, Chiayi, Taiwan, ROC |
| Abstract: | We have employed synchrotron radiation photoemission to investigate calcium fluoride deposited on Si(001)-2×1 annealed at 700 °C. The valence band spectra reveal that the initial molecules are dissociated to single Ca atoms resting on the surface. Si 2p core-level spectra manifest a negatively shifted Ca-induced line at 0.35 eV. The dissociated Ca atoms occupy only half of the surface, on top of which the CaF2 molecules commence growth. This is in contrast to the Si(111)-7×7 counterpart, which exhibits a CaF layer in the interface. Strong elastic scattering due to the absorbed Ca atoms is evident in the photoemission spectra, thus averaging out the angle-dependent features. |
| Keywords: | 73 20-r |
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