| 采用EPR谱和TEM对YSZ单晶辐照损伤的研究 |
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| 引用本文： | 祖小涛,封向东,雷雨,朱莎,王鲁闵. 采用EPR谱和TEM对YSZ单晶辐照损伤的研究[J]. 强激光与粒子束, 2005, 17(12): 1909-1912 |
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| 作者姓名： | 祖小涛 封向东 雷雨 朱莎 王鲁闵 |
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| 作者单位： | 电子科技大学,应用物理系,四川,成都,610054;四川大学,物理系,四川,成都,610065;美国密西根大学,核工程与放射科学系,安娜堡,MI,48109 |
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| 基金项目： | 国家自然科学基金委-中国工程物理研究院联合基金资助课题（10376006） |
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| 摘 要： | 利用电子顺磁共振(EPR)谱和透射电子显微镜(TEM)研究了YSZ单晶的辐照效应。200 keV的Xe和400 keV的Cs离子注入［111］取向的YSZ单晶中，注量均为5×1016 cm-2。EPR结果表明辐照产生了共振吸收位置g‖=1.989 和 g⊥=1.869、对称轴为［111］的六配位Zr3+顺磁缺陷。Cs辐照产生了比Xe 离子辐照多约150倍的六配位Zr3+顺磁缺陷。两种样品的剖面电子显微分析表明没有发现非晶化转变，但是Cs离子辐照的样品在损伤集中区域产生了密度较高的缺陷。因此，EPR谱和电子显微观察均说明在相同离位损伤(约160 dpa)的情况下，Cs离子辐照比Xe 离子辐照产生了更多的缺陷。造成这一现象的原因是Cs离子是化学活性的而Xe 离子却是惰性的。
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| 关 键 词： | YSZ单晶 离子辐照 辐照缺陷 电子顺磁共振谱 透射电子显微镜 |
| 文章编号： | 1001-4322(2005)12-1909-04 |
| 收稿时间： | 2005-02-21 |
| 修稿时间： | 2005-09-23 |
Study on irradiation damage of yttria-stabilized zirconia single crystals using ERP and TEM |
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| ZU Xiao-tao,FENG Xiang-dong,LEI Yu,ZHU Sha,WANG Lu-min. Study on irradiation damage of yttria-stabilized zirconia single crystals using ERP and TEM[J]. High Power Laser and Particle Beams, 2005, 17(12): 1909-1912 |
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| Authors: | ZU Xiao-tao FENG Xiang-dong LEI Yu ZHU Sha WANG Lu-min |
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| Affiliation: | 1. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054, China;2. Department of Physics, Sichuan University, Chengdu 610065, China;3. Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor MI48109, USA |
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| Abstract: | Electron paramagnetic resonance(EPR) and cross-sectional transmission electron microscopy were used to study defect structure and radiated damage mechanism.Single crystal samples of cubic zirconia stabilized by 9.5 mol.% Y2O3(YSZ) were implanted with 200 keV Xe ions and 400 keV Cs ions up to a dose of 5×1016 cm-2,respectively.EPR spectra show the trigonal signal with g_‖=1.989 and g_⊥=1.869,which exhibites axial symmetry with direction as symmetry axis composed of sixfold-coordinated Zr3+ sites.Peak-to-peak intensity(per unit volume) of Cs-ion irradiated YSZ is as about 150 time as that of Xe-ion irradiated YSZ,which indicates that the concentration of sixfold-coordinated Zr3+ defects produced by Cs-ion irradiation is far more than that of Xe-ion irradiated.The cross-sectional images of the irradiated samples show that the Cs-ion irradiation in YSZ produced more defect clusters than Xe-ion irradiation. |
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| Keywords: | YSZ single crystal Ion irradiation Irradiation defects Electron paramagnetic resonance TEM |
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