Über den Einfluss der Sekundäranregung und der Streuung auf die Röntgenfluoreszenzintensitäten bei der Lösungs-RFA |
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Authors: | Horst EbelElmar Hillbrand |
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Institution: | Institut für Angewandte Physik der Technischen Hochschule, Wien, Austria |
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Abstract: | For solution techniques, X-ray fluorescence intensities are-besides primary excitation-primarily influenced by scattering processes, and on a small rate by secondary excitation when compared with scattering. An increase of solved matter causes an increase of the secondary contribution and a decreasing scattering influence. This should be taken into account for selecting reference solution concentrations as well as for considering the accuracy of the method. |
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