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Valence-band offset of n-Zn0.8Mg0.2O/p-Ni0.8Mg0.2O heterojunction with tunable bandgaps of both sides measured by X-ray photoelectron spectroscopy
Authors:Yan-Min Guo  Li-Ping Zhu  Wen-Zhe Niu  Xiang-Yu Zhang  Zhi-Zhen Ye
Affiliation:1. State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, People’s Republic of China
2. Cyrus Tang Center for Sensor Materials and Applications, Zhejiang University, Hangzhou, 310027, People’s Republic of China
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