| 环氧树脂的飞行时间次级离子质谱 |
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| 引用本文： | 潘艺永,李越生,曹永明,陈维孝,宗祥福.环氧树脂的飞行时间次级离子质谱[J].分析化学,1999,27(2):158-161. |
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| 作者姓名： | 潘艺永 李越生 曹永明 陈维孝 宗祥福 |
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| 作者单位： | 复旦大学材料科学系,上海,200433 |
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| 摘 要： | 用飞行时间次级离子质谱结合银离化方法了集成电路封装用环氧模塑料的主要成分－－领甲酚环氧树脂。实验中测得ｎ＝０－４的树脂分子及相应的水解成分。碎片离子中除了芳香化合物通常具有的碎片外，还有反映树脂结构的碎片，通过对银离化了子的分析，推断中间不上的侧链是最可能断裂的
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| 关 键 词： | 飞行时间次级离子质谱 银离化 环氧树脂 |
Characterization of Cresol Epoxy by Time-of-flight Secondary Ion Mass Spectrometry |
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| Pan Yiyong,Li Yuesheng,Cao Yongming,Chen Weixiao,ZONG Xiangfu.Characterization of Cresol Epoxy by Time-of-flight Secondary Ion Mass Spectrometry[J].Chinese Journal of Analytical Chemistry,1999,27(2):158-161. |
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| Authors: | Pan Yiyong Li Yuesheng Cao Yongming Chen Weixiao ZONG Xiangfu |
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| Abstract: | Cresol epoxy used typically in microelectronic packaging has been characterized by time-of-flight secondary ion mass spectrometry using silver cationization technique. Oligomers containing up to 4 repeat units were detected with their hydrolytic components. Fragment ions characteristic of resin structure were detected in addition to the aromatic ions generally formed from aromatic compounds. It is concluded that side chain scission is mostly to take place in middle benzene ring. |
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| Keywords: | Time-of-flight secondary ion mass spectrometer silver cationizadon epoxy |
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