Scaling properties of eden clusters in three and four dimensions |
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Authors: | Pierre Devillard H. Eugene Stanley |
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Affiliation: | Center for Polymer Studies and Department of Physics, Boston University, Boston, MA 02215, USA |
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Abstract: | We study the scaling properties of noise reduced Eden clusters in three and four dimensions for variant B in the strip geometry. We find that the width W for large times behaves as a(s)g(L/sd−1), where L is the width of the strip, s the noise reduction parameter, d the dimension of space, and a(s) a decreasing function of s, g is a scaling function with the property g(u)→1/2 as u→0 and g(u)ux as u→∞, where χ is the roughness exponent. This scaling result leads to a new way of determining χ. In 3 dimensions, our numerical values for χ support a recent conjecture by Kim and Kosterlitz: χ = 2/(d + 2), and contradict all the former analytical conjectures. In 4 dimensions, we cannot distinguish between the conjectures of Kim and Kosterlitz and the conjecture of Wolf and Kertész, because large crossovers and finite size effects make the measurement of the exponents difficult. |
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