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Scaling properties of eden clusters in three and four dimensions
Authors:Pierre Devillard  H. Eugene Stanley
Affiliation:

Center for Polymer Studies and Department of Physics, Boston University, Boston, MA 02215, USA

Abstract:We study the scaling properties of noise reduced Eden clusters in three and four dimensions for variant B in the strip geometry. We find that the width W for large times behaves as a(s)g(L/sd−1), where L is the width of the strip, s the noise reduction parameter, d the dimension of space, and a(s) a decreasing function of s, g is a scaling function with the property g(u)→1/2 as u→0 and g(u)ux as u→∞, where χ is the roughness exponent. This scaling result leads to a new way of determining χ. In 3 dimensions, our numerical values for χ support a recent conjecture by Kim and Kosterlitz: χ = 2/(d + 2), and contradict all the former analytical conjectures. In 4 dimensions, we cannot distinguish between the conjectures of Kim and Kosterlitz and the conjecture of Wolf and Kertész, because large crossovers and finite size effects make the measurement of the exponents difficult.
Keywords:
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