In-situ monitoring of degradation of C/C composites and coatings in an inductively coupled plasma by a spectroCCD camera

Spatially and spectrally resolved profiles of atomic emission around the surface of C/C composites with double layer coatings in an inductively coupled plasma (ICP) have been measured by means of a spectroCCD camera. The plasma temperature around the sample disk was measured with the two-line method using atomic lines of iron, and found to be higher under oxidizing conditions because of combustion heat. This is a good measure of reflecting that the degradation is more significant under the oxidizing condition. The degradation procedure of the C/C composites with the double layer coatings has also been measured by a multi-channel spectrometer. The degradation of the sealant and the following attack of the plasma on a SiC layer were observed by the temporal change in emission intensity.