Accurate Measurement of a Small Defect in a Planar Waveguide |
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| Authors: | Jun Song Jinfei Ding |
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| Affiliation: | 1. Institute of Optoelectronics, Shenzhen University , Shenzhen, China;2. College of Electronic Science and Technology , Shenzhen University , Shenzhen, China |
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| Abstract: | Abstract A non-destructive test method of a small defect (a dust particle or an air bubble) in a strongly confined planar waveguide is demonstrated in this work. Based on strong resonances between the small defect and some special incident wavelengths, an accurate reconstruction of the defect parameters can quickly be obtained from our previous numerical method. An example is given to verify the validity of the present measurement method. |
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| Keywords: | planar waveguide point defect defect measurement |
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