3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. I. Flat sample |
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Authors: | M Servidori F Cembali S Milita |
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Institution: | (1) CNR – Istituto LAMEL, Via Gobetti 101, 40129 Bologna, Italy, IT |
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Abstract: | The 3D representation of the DuMond diagram is used to explain the dimensional features of X-ray topographs obtained by multi-crystal
configuration with a synchrotron beam. Symmetric Bragg-case reflections are considered for a flat double-crystal monochromator
and a flat sample. Two ways of sample alignment are taken into account. They are referred to as σ–σ and σ–π geometries, where
the diffraction plane of the sample is parallel and perpendicular, respectively, to the vertical diffraction plane of the
monochromator (σ polarization). It is shown that the shape of the sample image is closely connected to the shape the diffraction
domain common to monochromator and sample assumes in the 3D DuMond diagram. An experiment is reported for the less commonly
used σ–π topography, showing how the lattice mismatch and its lateral homogeneity are determined in samples made by epilayer
and substrate.
Received: 31 July 2000 / Accepted: 25 January 2001 / Published online: 3 May 2001 |
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Keywords: | PACS: 61 10 -i |
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