| Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray |
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| 引用本文： | 李哲,庹先国,杨剑波,刘明哲,成毅,王磊.Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray[J].中国物理 C,2013,37(1). |
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| 作者姓名： | 李哲 庹先国 杨剑波 刘明哲 成毅 王磊 |
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| 作者单位： | 1 State Key Laboratory of Geoharzard Prevention and Geoenvironment Protection, Chengdu University of Technology, Chengdu 610059, China;;2 Provincial Key Laboratory of Applied Nuclear Techniques in Geosciences, Chengdu University of Technology, Chengdu 610059, China;;3 Southwest University of Science and Technology, Mianyang 621010, China |
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| 摘 要： | A semi-empirical detector response function (DRF) model of Si (PIN) detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on statistical distribution analytic (SDA) method. The model for each single peak contains a step function, a Gaussian function and an exponential tail function. Parameters in the model are obtained by weighted nonlinear least-squares fitting method. In the application, six kinds of elements' characteristic X-ray spectra are obtained by Si (PIN) detector, and fitted out by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.
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| 关 键 词： | detector response function Si (PIN) detector statistical distribution analytic method weighted nonlinear least-squares fitting |
| 收稿时间： | 2012-3-2 |
| 修稿时间： | 2012-8-16 |
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