Presence of in-plane anisotropy and oscillatory magnetoresistive behavior in epitaxial SrRuO3 thin films with orthogonal equivalent axes

In-plane magnetic hysteresis measurements performed on thin films of SrRuO₃ (SRO) deposited on (001)-oriented SrTiO₃ substrates showed orthogonal equivalent axes. This finding, nevertheless, was not conclusive argument to discard the presence of in-plane anisotropy in these samples. Certainly, measurements of the in-plane magnetoresistance (MR) featured anisotropic behavior with a well-defined angular dependence. The observed 180° periodicity of the function MR(θ) corresponded to that expected for the standard anisotropic magnetoresistance phenomenon (AMR). On the other hand, the longitudinal MR (zero Lorentz force) and transverse MR (nonzero Lorentz force), recorded at low temperatures and magnetic fields, displayed positive MR with a relatively broad maximum for the first field ramp up to 4 T. For the subsequent field sweep down, MR was negative for all field orientations. The described behavior was symmetric upon reversal of the applied magnetic field leading to a strong hysteretic behavior of MR.