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High detectivity dilute nitride strained layer superlattice detectors for LWIR and VLWIR applications
Authors:Leye Aina  Harry Hier  Ayub Fathimulla  Mark Lecates  J. Kolodzey  Keith Goossen  Matthew Coppinger  Nurpur Bhargava
Affiliation:1. Epitaxial Technology, LLC, 1450 S. Rolling Road, Baltimore, MD 21227, United States;2. University of Delaware, Department of Electrical and Computer Engineering, 140 Evans Hall, Newark, DE 19716-3130, United States;1. Centro de Reconocimiento Molecular y Desarrollo Tecnológico (IDM), Unidad Mixta Universidad de Valencia-Universidad Politécnica de Valencia, Spain;2. Departamento de Química, Universidad Politécnica de Valencia, Camino de Vera s/n, 46022 Valencia, Spain;3. CIBER de Bioingeniería, Biomateriales y Nanomedicina (CIBER-BBN), Spain;4. Departamento de Química Orgánica, Universitat de València, Dr. Moliner 50, 46100 Burjassot, Valencia, Spain;5. Instituto de Ciencia de los Materiales (ICMUV), Universidad de Valencia, P.O. Box 22085, 46071 Valencia, Spain;1. Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, College of Optoelectronic Engineering, Chongqing University, 400044, China;2. Wide Bandgap Semiconductor Technology Disciplines State Key Laboratory, Xidian University, Xi’an 710071, China;1. Institute for Space Sciences, Free University of Berlin, Carl-Heinrich-Becker Weg, 6-10, 12165 Berlin, Germany;2. Laboratoire Atmosphères Milieux et Observations Spatiales (LATMOS), IPSL, Université Pierre et Marie Curie, Paris, France;3. Atmospheric and Oceanic Sciences, University of Wisconsin, 1225 W. Dayton St., Madison, WI 53705, USA;2. Indiana University Melvin and Bren Simon Cancer Center, Indianapolis, Indiana;3. Community Oncology Center, Kokomo, Indiana;4. University of Texas Southwestern Medical Center at Dallas, Dallas, Texas;6. Indiana University School of Medicine, Indianapolis, Indiana;1. Institute of Materials Science and Engineering, Ocean University of China, Qingdao City, Shandong Province, P.R. China;2. National Defense Key Disciplines Laboratory of Light Alloy Processing Science and Technology, Nanchang Hangkong University, Nanchang 330063, Jiangxi Province, P.R. China
Abstract:This paper will describe the first-of-a-kind development and demonstration of dilute nitride strained layer superlattice detectors with detectivity as high as 4 × 1010 cm Hz1/2/W and cut-off wavelength of 11-μm for an LWIR design and a cut-off wavelength of 22-μm for a VLWIR design. The developed dilute nitride SLS detectors are based on ultra-low leakage dilute nitride epitaxial layers and/or strained layer superlattices (SLS) of InAs/InAsSbN and InAs/GaInSbN that could enable high VLWIR detectivities at elevated temperatures and at low cost.
Keywords:
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