Structure of liquid SiO2: a measurement by high-energy x-ray diffraction

The x-ray structure factor for liquid SiO2 has been measured by laser heating of an aerodynamically levitated droplet. The main structural changes of the melt compared to the room temperature glass are associated with an increase in the size of the SiO4 tetrahedra, indicating a small reduction in the average Si-O-Si bond torsion angle and an expansion of the network between 5 and 9 A. Strong directional bonds with little high temperature broadening and a high degree of intermediate range order are found to persist in the liquid state.