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Electric field breakdown in borosilicate glass and other amorphous insulators |
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| Authors: | F Wooten |
| Institution: | Department of Applied Science, University of California, Davis, California 95616, USA |
| Abstract: | It is proposed that the intrinsic breakdown field strenght, EB, can be determined from P=σE2B where P is the power absorbed from an incident pulse of X-rays and σ is the measured conductivity. |
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