Characterization of high‐density bit‐patterned media using ultra‐high resolution magnetic force microscopy |
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| Authors: | S N Piramanayagam M Ranjbar R Sbiaa A Tavakkoli K G T C Chong |
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| Institution: | 1. Data Storage Institute, Agency for Science, Technology and Research (A*STAR), 117608 Singapore;2. Electrical and Computer Engineering Department, National University of Singapore, 117576 Singapore;3. NUS Graduate School for Integrative Sciences & Engineering (NGS), 117456 Singapore |
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| Abstract: | Bit‐patterned media at one terabit‐per‐square‐inch (Tb/in2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
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| Keywords: | bit‐patterned media magnetic force microscopy nanostructures perpendicular magnetic anisotropy |
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