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Investigation of defect luminescence from multicrystalline Si wafer solar cells using X‐ray fluorescence and luminescence imaging |
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| Authors: | Matthew P Peloso Natalie Palina Krzysztof Banas Agnieszka Banas Hidayat Hidayat Bram Hoex Mark B H Breese Armin G Aberle |
| Institution: | 1. Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, 117576 Singapore;2. Solar Energy Research Institute of Singapore (SERIS), National University of Singapore, 7 Engineering Drive 1, 117574 Singapore;3. Singapore Synchrotron Light Source, National University of Singapore, 5 Research Link, 117603 Singapore |
| Abstract: | Multicrystalline silicon wafer solar cells reveal performance‐ reducing defects by luminescence. X‐ray fluorescence spectra are used to investigate the elemental constituents from regions of solar cells yielding reverse‐bias or sub‐bandgap luminescence from defects. It is found that a higher concentration of metals is present in regions yielding reverse‐bias electroluminescence than in regions yielding sub‐bandgap electroluminescence. This suggests, dislocations do not create strong breakdown currents in the absence of impurity precipitates.  |
| Keywords: | solar cells silicon multicrystalline silicon defects luminescence X‐ray fluorescence |