首页 | 本学科首页   官方微博 | 高级检索  
     

直流脉冲磁控反应溅射技术制备掺铝氧化锌薄膜的研究
引用本文:陈超,冀勇,郜小勇,赵孟珂,马姣民,张增院,卢景霄. 直流脉冲磁控反应溅射技术制备掺铝氧化锌薄膜的研究[J]. 物理学报, 2012, 61(3): 36104-036104
作者姓名:陈超  冀勇  郜小勇  赵孟珂  马姣民  张增院  卢景霄
作者单位:郑州大学物理工程学院,郑州,450052
基金项目:国家自然科学基金(批准号: 60807001)、河南省教育厅自然科学研究计划项目(批准号: 2010A140017)和郑州大学研究生创新基金项目(批准号: 11L1902)资助的课题.
摘    要:文章采用直流脉冲磁控反应溅射(DCPsputtering)技术,在不同氧氩比(GFR)条件下玻璃衬底上制备了一系列掺铝氧化锌(AZO)薄膜,并利用X射线衍射、扫描电子显微镜和分光光度计从宏观应力和微观晶格畸变的角度研究了GFR对薄膜结构、表面形貌和光学特性的影响.制备的多晶AZO薄膜呈现了明显的ZnO-(103)择优取向,这归结于3小时薄膜沉积过程中伴随的退火引起的薄膜晶面能转变.随着GFR的增大,AZO薄膜内宏观拉应力先增大到最大值,随后宏观压应力随着GFR的继续增大而增大.薄膜中的宏观应力明显随着GFR从拉应力向压应力转变.这与晶格微观畸变诱导的微观应力的研究结果趋势恰恰相反.随着GFR的增加,薄膜在可见光区的平均透射率先增加后减小,薄膜晶粒尺寸诱导的晶界散射是影响薄膜透射率的主导机制.

关 键 词:掺铝氧化锌薄膜  直流脉冲磁控反应溅射  光学性质  氧氩比
收稿时间:2011-04-26
修稿时间:2011-06-01

Study on the deposition of aluminum-doped zinc oxide films using direct-current pulse magnetron reactive sputtering technique
Chen Chao,Ji Yong,Gao Xiao-Yong,Zhao Meng-Ke,Ma Jiao-Min,Zhang Zeng-Yuan and Lu Jing-Xiao. Study on the deposition of aluminum-doped zinc oxide films using direct-current pulse magnetron reactive sputtering technique[J]. Acta Physica Sinica, 2012, 61(3): 36104-036104
Authors:Chen Chao  Ji Yong  Gao Xiao-Yong  Zhao Meng-Ke  Ma Jiao-Min  Zhang Zeng-Yuan  Lu Jing-Xiao
Affiliation:School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China;School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China;School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China;School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China;School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China;School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China;School of Physics and Engineering, Zhengzhou University, Zhengzhou 450052, China
Abstract:Aluminum-doped zinc oxide (AZO) films have potential applications in photoconducting and piezo-electric devices, and gas and piezo sensors. Although the film structure and optical properties are intensively studied, the effect of gas flow ratio of O2 to Ar (GFR) on the film structure and optical properties has not been reported in terms of macrostress and lattice strain. In this paper, a series of AZO films is deposited on glass substrates by direct-current pulse magnetron reactive sputtering under different GFRs. The influence of the GFR on the crystalline structure, the surface topography, and the optical properties of the film is systematically studied in terms of macrostress and lattice strain by using X-ray diffractometry, scanning electron microscopy and spectrophotometry, respectively. The as-deposited AZO films are polycrystalline and (103) oriented, which can be attributed to the change in crystalline face energy during the accompanied thermal annealing for 3 h. The film tensile stress first increases to a maximum value, and then decreases gradually with GFR values increasing. It is noted that the transition from tensile to compressive stress occurs with GFR increasing. This result is different form that of lattice strain. The film transmissivity in the visible region first decreases and then increases with GFR increasing, which is attributed mainly to the scattering of grain boundary induced by the grain size.
Keywords:AZO film  direct-current pulse magnetron reactive sputtering  optical properties  gas flow ratio of oxygen to argon
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《物理学报》浏览原始摘要信息
点击此处可从《物理学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号