| 用准对称波导法测量薄膜参数 |
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| 引用本文： | 王宇明. 用准对称波导法测量薄膜参数[J]. 光学学报, 1988, 0(7) |
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| 作者姓名： | 王宇明 |
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| 作者单位： | 中国科学院光电技术研究所 |
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| 摘 要： | 本文指出了在棱镜耦合状态下降低平板波导基模截止厚度的途径,用文中提出的准对称波导法测量了薄的MgO膜的折射率和厚度,并给出了测量结果.
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| 关 键 词： | 光学薄膜 波导 |
Measurements of thin film parameters by quasi-symmetric waveguide method |
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| WANG YUMING. Measurements of thin film parameters by quasi-symmetric waveguide method[J]. Acta Optica Sinica, 1988, 0(7) |
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| Authors: | WANG YUMING |
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| Abstract: | A way to reduce the cut-off thicknesses of the fundamental modes in slab waveguides with prism couplers was presented. The MgO film parameters (refractive index and thickness) were measured by use of the quasi-symmetric waveguide method described in the paper, and the measurement results were given. |
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| Keywords: | thin film optics waveguide. |
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