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Time division vector optical sampling for ultrafast amplitude/phase modulation device characterization
Authors:Tsuchida Hidemi
Affiliation:National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba 305-8568, Japan. h?tsuchida@aist.go.jp
Abstract:A technique is proposed and demonstrated for measuring the waveforms of optical signals by making use of homodyne in-phase and quadrature detection combined with nonlinear optical sampling. The technique is based on time division sampling of electric field components with a discretely phase-modulated local oscillator light and is applied for the evaluation of the ultrafast response in a semiconductor optical amplifier.
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