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Estimates of Stark broadening of some Si(II) lines
Authors:John D. Hey
Affiliation:Department of Physics, University of Cape Town, Rondebosch, C.P. 7700, South Africa
Abstract:Recent measurements of spectral line widths for the first five multiplets in the visible of singly-ionized silicon, are compared with the corresponding values predicted by the semi-empirical method of Griem, as well as two other Stark broadening theories. Although there is considerable disagreement between different measurements, as well as with and between the theories involved, agreement to better than 30% on average is obtained between these calculations and the computations of Sahal-Bréchot. Some of the experimental and theoretical questions involved are discussed and suggestions are made for future work on the subject.
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