The influence of core hole relaxation on the main-line intensities in X-ray photoelectron spectra |
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| Institution: | 1. Institute of Materials Science, University of Silesia, 75 Pułku Piechoty 1A, PL-41-500 Chorzów, Poland;2. Département de chimie, Université de Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada |
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| Abstract: | The main photoelectron line spectroscopic factors that are currently used in photoelectron spectroscopy for quantitative analysis are calculated for a broad set of atoms. General trends of the behaviour of the spectroscopic factors of core atomic levels are discussed. The influence of the spectroscopic factors on the main line intensities and on concentrations of the elements, that are obtained using X-ray photoelectron spectra, is analysed. |
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