Characterization of the effects of soft X-ray irradiation on polymers

The physical and chemical effects of the soft X-ray irradiation of polymers have been systematically evaluated for photon energies just above the C 1s binding energy. This exposure causes radiation damage in the form of the loss of mass and changes to the chemical structure of the polymers. These effects are evident in the Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra of the exposed polymers, posing a fundamental limit to the sensitivity of NEXAFS spectroscopy for chemical microanalysis. Quantitative understanding of the chemistry and kinetics of radiation damage in polymers is necessary for the successful and validated application of NEXAFS microscopy. This paper outlines a method for quantifying this radiation damage as a function of X-ray dose, and applies these methods to characterize the loss of mass and loss of carbonyl group functionality from a diverse series of polymers. A series of simple correlations are proposed to rationalize the observed radiation damage propensities on the basis of the polymer chemical structure. In addition, NEXAFS spectra of irradiated and virgin polymers are used to provide a first-order identification of the radiation chemistry.