Synthesis, structural and magnetic study of polycrystalline LaNi1−xMnxO3 films |
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Authors: | Yijing GuYunfeng Wang Tao Wang Wangzhou Shi |
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Institution: | Key Laboratory of Optoelectronic Material and Device, Shanghai Normal University, 200234 Shanghai, People''s Republic of China |
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Abstract: | Polycrystalline double perovskite LaNi1−xMnxO3 (x=0.3, 0.4, 0.5 and 0.7, which is defined as Mn03, Mn04, Mn05 and Mn07, respectively) thin films are successfully deposited on Si (1 0 0) substrates via chemical solution deposition method. Their structural and magnetic properties are measured. All the thin films are of single phase. Raman spectra indicate that relative intensity of Mn05 is stronger than that of others that can be attributed to the higher degree of B-site ordering. The low temperature magnetic moment of Mn05 is about 500 emu/cm3, which is obviously larger than that of Mn03 and Mn07 because of the long-range ordering of Mn and Ni ions in Mn05. |
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Keywords: | Thin films Sol-gel processes RAMAN spectra Magnetic measurements |
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