Selective excitation and integral counting of x‐ray fluorescence (SEICXRF)

This paper proposes a spectrometric method for x‐ray fluorescence, based on selective excitation and integral counting of the emitted photons by the sample. It is named SEICXRF (Selective Excitation and Integral Counting of X‐Ray Fluorescence). The general characteristics of the method are shown: the spectrometer, the spectrum acquisition, the effects involved in the determination of the jump intensity and their respective algorithms (the primary and secondary intensities and other unexpected effects), its capacity to identify elements, its sensitivity, its limitations and scope. Copyright © 2003 John Wiley & Sons, Ltd.