| Abstract: | A method to quantify the composition of thin films using infrared spectroscopic ellipsometry (IRSE), supplemented by visible spectroscopic ellipsometry (VISSE), is proposed. Because ellipsometry measures the thickness and optical constants of a surface layer simultaneously, the absorption coefficient of the film as a function of wavelength can be obtained. Using values of the absorption coefficients for the pure components of the film, the percentages (mol.% or wt.%) of each component in the film can be calculated. The method is demonstrated in a study of the hydration of oxide films on electropolished aluminium and the anodically formed barrier oxide film. The IRSE technique shows that hydration of the films by immersion in boiling water results in the conversion of aluminium oxide to pseudoboehmite. Copyright © 2003 John Wiley & Sons, Ltd. |
