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Comparison of site-specific valence band densities of states determined from Auger spectra and XPS-determined valence band spectra in GeS (001) and GeSe (001)
Authors:G.D. Davis  P.E. Viljoen  M.G. Lagally
Affiliation:Department of Metallurgical and Mineral Engineering and Materials Science Center, University of Wisconsin, Madison, Wisconsin 53706 U.S.A.
Abstract:Auger lineshapes of the Ge M1M4,5V and M3M4,5V and Se M1M4,5V transitions in GeS (001) and GeSe (001) are measured and compared to XPS valence band spectra. Distortions in both types of spectra due to inelastic scattering, analyzer and source broadening, and core level lifetime broadening are removed by deconvolution techniques. The valence band consists of three main peaks at ?2 eV, ?8 eV, and ?13 eV. There is excellent agreement of peak positions in AES and XPS spectra. The Auger lineshapes can be interpreted in terms of site-specific densities of states. They indicate that the states at ~?8 eV and at ~?13 eV are associated with the cation and anion sites respectively. The bonding p-like states at the top of the valence band have both cation and anion character. The Auger lineshapes indicate that the states closest to the valence band maximum are preferentially associated with Ge.
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