Coherence artifacts in second harmonic microscopy |
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| Authors: | G.A. Reider M. Cernusca M. Hofer |
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| Affiliation: | Technische Universit?t Wien, Inst. 359 – Abteilung Quantenelektronik und Lasertechnik, Gusshausstr. 27/359-4, A-1040 Vienna, Austria (E-mail: reider@tuwien.ac.at), AT
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| Abstract: | We present an analysis of these effects and demonstrate a simple, yet powerful technique to eliminate these coherence artifacts. The technique relies on a superposition of the signal field with a coherent auxiliary SH-field of controllable phase and amplitude and allows a direct observation of the true χ(2)-morphology of the interface. Recieved: 20 September 1998 |
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| Keywords: | PACS: 42.30 07.79 42.65.k |
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