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电子储存环中离子俘获不稳定性的强-强模型模拟
引用本文:李永军,李国民,金玉明,刁操正,刘功发,李京韦,周安奇,于象坤,何晓业,刘祖平. 电子储存环中离子俘获不稳定性的强-强模型模拟[J]. 强激光与粒子束, 2000, 12(5): 643-646
作者姓名:李永军  李国民  金玉明  刁操正  刘功发  李京韦  周安奇  于象坤  何晓业  刘祖平
作者单位:中国科学技术大学国家同步辐射实验室,合肥市6022信箱,230029
摘    要: 电子储存环中,由于被束流势阱俘获的离子会引起束流不稳定性。研究这种不稳定性的产生机制和抑制方法对提高机器的性能有重要理论和现实意义。介绍了用强-强模型对合肥光源(HLS)电子储存环中离子俘获不稳定性产生机制进行的模拟研究。模拟结果可用于理解在合肥光源(HLS)储存环上观察到的离子俘获现象。

关 键 词:电子储存环  离子俘获不稳定性  强-强模型
收稿时间:1900-01-01;
修稿时间:2000-01-20

Simulation of the Ion-trapping Instability Using Strong-strong Model in an Electron Storage Ring
LIYong-jun,LIWei-min,JINYu-ming,DIAOCao-zheng,LIUGong-fa,LI,Jing-yi,ZHOUAn-qi,YUXiang-kun,HEXiao-ye,LIUZu-ping. Simulation of the Ion-trapping Instability Using Strong-strong Model in an Electron Storage Ring[J]. High Power Laser and Particle Beams, 2000, 12(5): 643-646
Authors:LIYong-jun  LIWei-min  JINYu-ming  DIAOCao-zheng  LIUGong-fa  LI  Jing-yi  ZHOUAn-qi  YUXiang-kun  HEXiao-ye  LIUZu-ping
Abstract:The ions trapped by beam potential well can cause beam instability in e lectron storage rings. It is important to study the mechanism and suppress method of the instability to increase the perform level of machine. In this paper, the simulation methods and results of ion-trapping instability using strong-strong model were introduced for the HLS ring. These results can be used to understand the phenomena observed in the HLS ring.
Keywords:electron storage ring  ion-tr apping instability  strong-strong model
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