Accurate determination of the Ca:P ratio in rough hydroxyapatite samples by SEM‐EDS,PIXE and RBS—a comparative study |
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Authors: | M. J. Bailey S. Coe D. M. Grant G. W. Grime C. Jeynes |
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Affiliation: | 1. University of Surrey Ion Beam Centre, Guildford, GU2 7XH, UK;2. Department of Materials Science, University of Nottingham, NG7 2RD, UK |
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Abstract: | The Ca:P ratio in a certified standard of hydroxyapatite was determined by X‐ray spectrometry (XRS), with the X‐rays excited by both electrons and ions using energy dispersive spectroscopy on the scanning electron microscope (SEM‐EDS) and particle‐induced X‐ray emission (PIXE). The certified value of Ca:P was accurately verified by 3 MeV 4He+ Rutherford Backscattering Spectrometry (RBS). We show that the demonstrably rough surface of this sample does not cause perturbation of the Ca:P ratio within the uncertainties of each of the XRS measurements. Copyright © 2009 John Wiley & Sons, Ltd. |
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