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Improvements of the low‐energy performance of a micro‐focus x‐ray source for XRF analysis with the SEM
Authors:M. Procop  V.‐D. Hodoroaba  A. Bjeoumikhov  R. Wedell  A. Warrikhoff
Affiliation:1. Bundesanstalt für Materialforschung und—prüfung (BAM), D‐12200 Berlin, Germany;2. IfG—Institute for Scientific Instruments, D‐12489 Berlin, Germany;3. IAP—Institut für angewandte Photonik eV, D‐12489 Berlin, Germany;4. rtw RONTGEN‐TECHNIK Dr. WARRIKHOFF GmbH & Co KG, D‐15366 Neuenhagen, Germany
Abstract:X‐ray Fluorescence (XRF) with a scanning electron microscope (SEM) is a valuable completion of the analytical capabilities of SEMs. Small and compact micro‐focus x‐ray sources are mounted to the microscope chamber, and the x‐ray spectra are monitored with conventional EDS systems. Up to now the x‐ray tubes used for the micro‐focus x‐ray sources are equipped with beryllium windows about 100 µm thick. The poly‐capillary x‐ray lenses have their transmission maximum at photon energies around 10 keV. It drops down in both low‐ and high‐energy ranges. Hence, L‐radiation from an Mo or Rh target will be strongly attenuated, and the excitation of fluorescence in the soft x‐ray range becomes very ineffective. A new micro‐focus x‐ray source was developed. It is characterised by a lower self‐absorption in the tube target, thin beryllium windows and an x‐ray optics having a large distance between its foci and the maximum of transmission at about 5 keV. Thus K line fluorescence of light elements becomes effectively excited by the L‐radiation from Mo or Rh tube targets. The detection limit for sodium oxide in glass was found to be below 1 mass%. Copyright © 2009 John Wiley & Sons, Ltd.
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